Lag-Free CCID for Image Information Processing


The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 5, No. 2, pp. 553-557, Feb. 1998
10.3745/KIPSTE.1998.5.2.553,   PDF Download:

Abstract

The background blemish in the CCID(Charge-Coupled Imageing Device) for the image information processing is caused by image lag which appears when the electric field in the photodiode region of the pixel becomes below IE3V/cm. In this study, we formed 1.7um deep photodiode junction in a pixel. The deep photodiode junction reduced the distance between photodiode region and VCCD region inside the pixel, which in turn lowered the potential barrier in the turn-on Gate channel region. Which the lowered potential barrier, we can suppress image lag by keep int the electric field of the photodiode region above IE3V/cm and that of TG about IE5V/cm. Thus, we were able to remove the background blemish caused by image in the CCID.


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Cite this article
[IEEE Style]
P. Yong and L. Y. Hee, "Lag-Free CCID for Image Information Processing," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 5, no. 2, pp. 553-557, 1998. DOI: 10.3745/KIPSTE.1998.5.2.553.

[ACM Style]
Park Yong and Lee Young Hee. 1998. Lag-Free CCID for Image Information Processing. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 5, 2, (1998), 553-557. DOI: 10.3745/KIPSTE.1998.5.2.553.