Program Plagiarism Detection through Memory Access Log Analysis
The KIPS Transactions:PartD, Vol. 13, No. 6, pp. 833-838, Oct. 2006
http://dx.doi.org/10.3745/KIPSTD.2006.13D.6.833, PDF Download:
Keywords: program plagiarism, Algorithm Similarity Memory Access Log
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Cite this article
[IEEE Style]
P. Sung-Yun and H. Sang-Yong, "Program Plagiarism Detection through Memory Access Log Analysis," The KIPS Transactions:PartD, vol. 13, no. 6, pp. 833-838, 2006. DOI: http://dx.doi.org/10.3745/KIPSTD.2006.13D.6.833.
[ACM Style]
Park Sung-Yun and Han Sang-Yong. 2006. Program Plagiarism Detection through Memory Access Log Analysis. The KIPS Transactions:PartD, 13, 6, (2006), 833-838. DOI: http://dx.doi.org/10.3745/KIPSTD.2006.13D.6.833.