Traceability of UML Based Test Artifacts Using XML
The KIPS Transactions:PartD, Vol. 16, No. 2, pp. 213-222, Apr. 2009
10.3745/KIPSTD.2009.16.2.213, PDF Download:
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Cite this article
[IEEE Style]
K. I. Seo and E. M. Choi, "Traceability of UML Based Test Artifacts Using XML," The KIPS Transactions:PartD, vol. 16, no. 2, pp. 213-222, 2009. DOI: 10.3745/KIPSTD.2009.16.2.213.
[ACM Style]
Kwang Ik Seo and Eun Man Choi. 2009. Traceability of UML Based Test Artifacts Using XML. The KIPS Transactions:PartD, 16, 2, (2009), 213-222. DOI: 10.3745/KIPSTD.2009.16.2.213.