Method and Application of Searching Hot Spot For Reengineering Software Using AOP


The KIPS Transactions:PartD, Vol. 16, No. 1, pp. 83-92, Feb. 2009
10.3745/KIPSTD.2009.16.1.83,   PDF Download:

Abstract

Complicated business logic makes program complexity more complicated. It's inevitable that the program must undergo reengineering processes all the way of in its lifetime. Hot spot analysis that has diverse purposes is getting an important question more and more. As a rule, reengineering process is done by UML model-based approach to analyze the legacy system. The smallest fragment of targets to be analysed is unit, that is function or class. Today's software development is to deal with huge change of software product and huge class including heavy quantity of LOC(Lines Of Code). However, analysis of unit is not precise approach process for reliable reengineering consequence. In this paper, we propose very precise hot spot analysis approach using Aspect-Oriented Programming languages, such as AspectJ. Typically the consistency between UML and source is needed code to redefine the modified library or framework boundaries. But reengineering approach using AOP doesn't need to analyze UML and source code. This approach makes dynamic event log data that contains detailed program interaction information. This dynamic event log data makes it possible to analyze hot spot.


Statistics
Show / Hide Statistics

Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.


Cite this article
[IEEE Style]
E. S. Lee and E. M. Choi, "Method and Application of Searching Hot Spot For Reengineering Software Using AOP," The KIPS Transactions:PartD, vol. 16, no. 1, pp. 83-92, 2009. DOI: 10.3745/KIPSTD.2009.16.1.83.

[ACM Style]
Ei Sung Lee and Eun Man Choi. 2009. Method and Application of Searching Hot Spot For Reengineering Software Using AOP. The KIPS Transactions:PartD, 16, 1, (2009), 83-92. DOI: 10.3745/KIPSTD.2009.16.1.83.