A Study on Software Fault Analysis and Management Method using Defect Tracking System
The KIPS Transactions:PartD, Vol. 15, No. 3, pp. 321-326, Jun. 2008
10.3745/KIPSTD.2008.15.3.321, PDF Download:
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Cite this article
[IEEE Style]
Y. J. Moon and S. Y. Rhew, "A Study on Software Fault Analysis and Management Method using Defect Tracking System," The KIPS Transactions:PartD, vol. 15, no. 3, pp. 321-326, 2008. DOI: 10.3745/KIPSTD.2008.15.3.321.
[ACM Style]
Young Joon Moon and Sung Yul Rhew. 2008. A Study on Software Fault Analysis and Management Method using Defect Tracking System. The KIPS Transactions:PartD, 15, 3, (2008), 321-326. DOI: 10.3745/KIPSTD.2008.15.3.321.