Rigorous System Testing by Supporting Vertical Traceability
The KIPS Transactions:PartD, Vol. 14, No. 7, pp. 753-762, Dec. 2007
10.3745/KIPSTD.2007.14.7.753, PDF Download:
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Cite this article
[IEEE Style]
S. K. Ik and E. M. Choi, "Rigorous System Testing by Supporting Vertical Traceability," The KIPS Transactions:PartD, vol. 14, no. 7, pp. 753-762, 2007. DOI: 10.3745/KIPSTD.2007.14.7.753.
[ACM Style]
Seo Kwang Ik and Eun Man Choi. 2007. Rigorous System Testing by Supporting Vertical Traceability. The KIPS Transactions:PartD, 14, 7, (2007), 753-762. DOI: 10.3745/KIPSTD.2007.14.7.753.