A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution
The KIPS Transactions:PartD, Vol. 11, No. 6, pp. 1287-1294, Oct. 2004
10.3745/KIPSTD.2004.11.6.1287, PDF Download:
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Cite this article
[IEEE Style]
J. Y. Park, J. H. Park, Y. S. Kim, "A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution," The KIPS Transactions:PartD, vol. 11, no. 6, pp. 1287-1294, 2004. DOI: 10.3745/KIPSTD.2004.11.6.1287.
[ACM Style]
Joong Yang Park, Jae Heung Park, and Young Soon Kim. 2004. A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution. The KIPS Transactions:PartD, 11, 6, (2004), 1287-1294. DOI: 10.3745/KIPSTD.2004.11.6.1287.