Automatic Test Data Generation for Mutation Testing Using Genetic Algorithms
The KIPS Transactions:PartD, Vol. 8, No. 1, pp. 81-87, Feb. 2001
10.3745/KIPSTD.2001.8.1.81, PDF Download:
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Cite this article
[IEEE Style]
I. S. Jung and B. M. Chang, "Automatic Test Data Generation for Mutation Testing Using Genetic Algorithms," The KIPS Transactions:PartD, vol. 8, no. 1, pp. 81-87, 2001. DOI: 10.3745/KIPSTD.2001.8.1.81.
[ACM Style]
In Sang Jung and Byeong Mo Chang. 2001. Automatic Test Data Generation for Mutation Testing Using Genetic Algorithms. The KIPS Transactions:PartD, 8, 1, (2001), 81-87. DOI: 10.3745/KIPSTD.2001.8.1.81.