An Input Domain - Based Software Reliability Growth Model


The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 7, No. 11, pp. 3384-3393, Nov. 2000
10.3745/KIPSTE.2000.7.11.3384,   PDF Download:

Abstract

A number of software reliability growth models (SRGMs) have been developed for evaluating software reliability growth behavior by analyzing the failure data obtained during testing software systems. However, since these SRGMs are based on several assumptions about software development and usage environments, SRGMs are inadequate for circumstances in which such assumptions do not hold or software systems rarely fail. The existing input domain-based reliability models, which do not require assumptions on software development and usage environment, deal the software system before debugging and the software system after debugging independently. Therefore many test inputs are usually demanded. This paper thus suggests an input domain-based SRGM, which does not require such assumptions and is based on the testing procedure that tests concurrently both the software system before debugging and the software system after debugging. The suggested model uses all the available data, the required number of test inputs can be possibly reduced. This reduction may compensate for the excessive testing time caused by executing the software systems before and after debugging. Its statistical characteristics are investigated and it is compared with similar approaches developed for the software maintenance phase.


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Cite this article
[IEEE Style]
J. Y. Park, D. W. Seo, Y. S. Kim, "An Input Domain - Based Software Reliability Growth Model," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 7, no. 11, pp. 3384-3393, 2000. DOI: 10.3745/KIPSTE.2000.7.11.3384.

[ACM Style]
Joong Yang Park, Dong Woo Seo, and Young Soon Kim. 2000. An Input Domain - Based Software Reliability Growth Model. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 7, 11, (2000), 3384-3393. DOI: 10.3745/KIPSTE.2000.7.11.3384.