Software Reliability Growth Modeling in the Testing Phase with an Outlier Stage
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 5, No. 10, pp. 2575-2583, Oct. 1998
10.3745/KIPSTE.1998.5.10.2575, PDF Download:
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Cite this article
[IEEE Style]
P. M. Gon and J. E. Yi, "Software Reliability Growth Modeling in the Testing Phase with an Outlier Stage," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 5, no. 10, pp. 2575-2583, 1998. DOI: 10.3745/KIPSTE.1998.5.10.2575.
[ACM Style]
Park Man Gon and Jung Eun Yi. 1998. Software Reliability Growth Modeling in the Testing Phase with an Outlier Stage. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 5, 10, (1998), 2575-2583. DOI: 10.3745/KIPSTE.1998.5.10.2575.