Design of the Memory Error Test Module at a Device Driver of the Linux


The KIPS Transactions:PartA, Vol. 14, No. 3, pp. 185-190, Jun. 2007
10.3745/KIPSTA.2007.14.3.185,   PDF Download:

Abstract

The necessity of error test module is increasing as development of embedded Linux device driver. This paper proposes the basic concept of freed memory error test module in the Linux device driver and designs error test module. The USB device driver is designed for freed memory error test module. I insert the test code to verify the USB device driver. I test the suggested error test module for the USB storage device driver. I experiment error test in this module.


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Cite this article
[IEEE Style]
S. J. Jang, "Design of the Memory Error Test Module at a Device Driver of the Linux," The KIPS Transactions:PartA, vol. 14, no. 3, pp. 185-190, 2007. DOI: 10.3745/KIPSTA.2007.14.3.185.

[ACM Style]
Seung Ju Jang. 2007. Design of the Memory Error Test Module at a Device Driver of the Linux. The KIPS Transactions:PartA, 14, 3, (2007), 185-190. DOI: 10.3745/KIPSTA.2007.14.3.185.