Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation


The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 4, No. 3, pp. 767-774, Mar. 1997
10.3745/KIPSTE.1997.4.3.767,   PDF Download:

Abstract

A procedure presented in this paper generates test sequences to check the conformity of an implementation with a protocol specification, which is modeled as a deterministic finite state machine(FSM). We proposed a technique to determine a minimum-cost tour of the transition graph of the FSM. The technique using Multiple UIO and Shortest Path(MUSP) saves the cost 1~9% over MUIO and directly, derive a symmetric test graph from an FSM graph. From this fact, we proposed a technique using Multiple Unique State Signature(MUSS) to solve an open issue that the multiple UIO assignment may not minimize the length of the tour. In this paper, the proposed technique is, also, applied to generate a synchronizable test sequence. And the result shows that the technique using MUSP and MUSS saves the cost 7~29% and 7~42% over the previous approach using MUIO, respectively.


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Cite this article
[IEEE Style]
J. Y. Hee and H. B. Gee, "Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 4, no. 3, pp. 767-774, 1997. DOI: 10.3745/KIPSTE.1997.4.3.767.

[ACM Style]
Jung Yoon Hee and Hong Beum Gee. 1997. Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 4, 3, (1997), 767-774. DOI: 10.3745/KIPSTE.1997.4.3.767.