Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 4, No. 3, pp. 767-774, Mar. 1997
10.3745/KIPSTE.1997.4.3.767, PDF Download:
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Cite this article
[IEEE Style]
J. Y. Hee and H. B. Gee, "Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 4, no. 3, pp. 767-774, 1997. DOI: 10.3745/KIPSTE.1997.4.3.767.
[ACM Style]
Jung Yoon Hee and Hong Beum Gee. 1997. Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 4, 3, (1997), 767-774. DOI: 10.3745/KIPSTE.1997.4.3.767.