Test Pattern Generation for Combinational Circuits using Inherited Values
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 4, No. 2, pp. 606-615, Feb. 1997
10.3745/KIPSTE.1997.4.2.606, PDF Download:
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Cite this article
[IEEE Style]
S. S. Hoon, "Test Pattern Generation for Combinational Circuits using Inherited Values," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 4, no. 2, pp. 606-615, 1997. DOI: 10.3745/KIPSTE.1997.4.2.606.
[ACM Style]
Song Sang Hoon. 1997. Test Pattern Generation for Combinational Circuits using Inherited Values. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 4, 2, (1997), 606-615. DOI: 10.3745/KIPSTE.1997.4.2.606.