Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 1, No. 2, pp. 272-278, Jul. 1994
10.3745/KIPSTE.1994.1.2.272, PDF Download:
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Cite this article
[IEEE Style]
K. Y. Sook, "Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 1, no. 2, pp. 272-278, 1994. DOI: 10.3745/KIPSTE.1994.1.2.272.
[ACM Style]
Kim Yeoun Sook. 1994. Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 1, 2, (1994), 272-278. DOI: 10.3745/KIPSTE.1994.1.2.272.