Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits


The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 1, No. 2, pp. 272-278, Jul. 1994
10.3745/KIPSTE.1994.1.2.272,   PDF Download:

Abstract

The paper proposes a test pattern generator and a signature analyzer required for pseudoexhaustive testing of the combinational circuit part within a sequential circuit when performing built-in self test of the circuit. The test pattern generator can scan in the seed test pattern and generate exhaustive test patterns. The signature analyzer can perform the analysis of the circuit response and scan out the result. Such test pattern generator and signature analyzer have been developed using SRL(shift register latch) and LFSR(linear feedback shift register).


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Cite this article
[IEEE Style]
K. Y. Sook, "Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 1, no. 2, pp. 272-278, 1994. DOI: 10.3745/KIPSTE.1994.1.2.272.

[ACM Style]
Kim Yeoun Sook. 1994. Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 1, 2, (1994), 272-278. DOI: 10.3745/KIPSTE.1994.1.2.272.