Built-In Self Repair for Embedded NAND-Type Flash Memory


KIPS Transactions on Computer and Communication Systems, Vol. 3, No. 5, pp. 129-140, May. 2014
10.3745/KTCCS.2014.3.5.129,   PDF Download:

Abstract

BIST(Built-in self test) is to detect various faults of the existing memory and BIRA(Built-in redundancy analysis) is to repair detectedfaults by allotting spare. Also, BISR(Built-in self repair) which integrates BIST with BIRA, can enhance the whole memory’s yield.However, the previous methods were suggested for RAM and are difficult to diagnose disturbance that is NAND-type flash memory’sintrinsic fault when used for the NAND-type flash memory with different characteristics from RAM’s memory structure. Therefore, thispaper suggests a BISD(Built-in self diagnosis) to detect disturbance occurring in the NAND-type flash memory and to diagnose thelocation of fault, and BISR to repair faulty blocks.


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Cite this article
[IEEE Style]
T. H. Kim and H. Chang, "Built-In Self Repair for Embedded NAND-Type Flash Memory," KIPS Transactions on Computer and Communication Systems, vol. 3, no. 5, pp. 129-140, 2014. DOI: 10.3745/KTCCS.2014.3.5.129.

[ACM Style]
Tae Hwan Kim and Hoon Chang. 2014. Built-In Self Repair for Embedded NAND-Type Flash Memory. KIPS Transactions on Computer and Communication Systems, 3, 5, (2014), 129-140. DOI: 10.3745/KTCCS.2014.3.5.129.