Trigger design to software defect analysis


The KIPS Transactions:PartD, Vol. 10, No. 4, pp. 709-718, Aug. 2003
10.3745/KIPSTD.2003.10.4.709,   PDF Download:

Abstract

This research introduces defect and its causes that happen on software development. Based on defect cause analysis, we understand associated relation between defects and them design defect trigger. So, when we achieve similar project, we can forecast defect and prepare to solve defect by using defect trigger.


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Cite this article
[IEEE Style]
L. E. Seo and L. G. Hwan, "Trigger design to software defect analysis," The KIPS Transactions:PartD, vol. 10, no. 4, pp. 709-718, 2003. DOI: 10.3745/KIPSTD.2003.10.4.709.

[ACM Style]
Lee Eun Seo and Lee Gyeong Hwan. 2003. Trigger design to software defect analysis. The KIPS Transactions:PartD, 10, 4, (2003), 709-718. DOI: 10.3745/KIPSTD.2003.10.4.709.