An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment
The KIPS Transactions:PartD, Vol. 9, No. 4, pp. 659-666, Aug. 2002
10.3745/KIPSTD.2002.9.4.659, PDF Download:
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Cite this article
[IEEE Style]
J. Y. Park, Y. S. Kim, Y. S. Hwang, "An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment," The KIPS Transactions:PartD, vol. 9, no. 4, pp. 659-666, 2002. DOI: 10.3745/KIPSTD.2002.9.4.659.
[ACM Style]
Joong Yang Park, Young Soon Kim, and Yang Sook Hwang. 2002. An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment. The KIPS Transactions:PartD, 9, 4, (2002), 659-666. DOI: 10.3745/KIPSTD.2002.9.4.659.