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Search: "[ author: In Sang Chung ]" (6)
    An automation method for GUI test using a UIA Library
    Chang Min Choi , In Sang Chung , Hyeon Soo Kim The KIPS Transactions:PartD, Vol. 18, No. 5, pp. 343-356, Oct. 2011
    10.3745/KIPSTD.2011.18.5.343

    Detection of Potential Memory Access Errors based on Assembly Codes
    Hyun Soo Kim , Byeong Man Kim , Hyun Seop Bae , In Sang Chung The KIPS Transactions:PartD, Vol. 18, No. 1, pp. 35-44, Feb. 2011
    10.3745/KIPSTD.2011.18.1.35

    Automated Test Data Generation for Testing Programs with Multi-Level Stack-directed Pointers
    In Sang Chung The KIPS Transactions:PartD, Vol. 17, No. 4, pp. 297-310, Aug. 2010
    10.3745/KIPSTD.2010.17.4.297

    Automated Black-Box Test Case Generation for MC/DC with SAT
    In Sang Chung The KIPS Transactions:PartD, Vol. 16, No. 6, pp. 911-920, Dec. 2009
    10.3745/KIPSTD.2009.16.6.911

    Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT
    In Sang Chung The KIPS Transactions:PartD, Vol. 16, No. 3, pp. 371-380, Jun. 2009
    10.3745/KIPSTD.2009.16.3.371

    An Alloy Specification Based Automated Test Data Generation Technique
    In Sang Chung The KIPS Transactions:PartD, Vol. 14, No. 2, pp. 191-202, Apr. 2007
    10.3745/KIPSTD.2007.14.2.191

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