Adaptive Random Testing through Iterative Partitioning with Enlarged Input Domain
The KIPS Transactions:PartD, Vol. 15, No. 4, pp. 531-540, Aug. 2008
10.3745/KIPSTD.2008.15.4.531, PDF Download:
Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
S. H. Shin and S. K. Park, "Adaptive Random Testing through Iterative Partitioning with Enlarged Input Domain," The KIPS Transactions:PartD, vol. 15, no. 4, pp. 531-540, 2008. DOI: 10.3745/KIPSTD.2008.15.4.531.
[ACM Style]
Seung Hun Shin and Seung Kyu Park. 2008. Adaptive Random Testing through Iterative Partitioning with Enlarged Input Domain. The KIPS Transactions:PartD, 15, 4, (2008), 531-540. DOI: 10.3745/KIPSTD.2008.15.4.531.