An Evaluation of Software Quality Using Phase-based Defect Profile
The KIPS Transactions:PartD, Vol. 15, No. 3, pp. 313-320, Jun. 2008
10.3745/KIPSTD.2008.15.3.313, PDF Download:
Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
S. U. Lee, "An Evaluation of Software Quality Using Phase-based Defect Profile," The KIPS Transactions:PartD, vol. 15, no. 3, pp. 313-320, 2008. DOI: 10.3745/KIPSTD.2008.15.3.313.
[ACM Style]
Sang Un Lee. 2008. An Evaluation of Software Quality Using Phase-based Defect Profile. The KIPS Transactions:PartD, 15, 3, (2008), 313-320. DOI: 10.3745/KIPSTD.2008.15.3.313.