The Optimal Threshold for ECN Marking
The KIPS Transactions:PartC, Vol. 12, No. 4, pp. 559-570, Aug. 2005


Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
G. Y. Lee, J. G. Yim, I. H. Jang, "The Optimal Threshold for ECN Marking," The KIPS Transactions:PartC, vol. 12, no. 4, pp. 559-570, 2005. DOI: 10.3745/KIPSTC.2005.12.4.559.
[ACM Style]
Gye Young Lee, Jae Geol Yim, and Ik Hyeon Jang. 2005. The Optimal Threshold for ECN Marking. The KIPS Transactions:PartC, 12, 4, (2005), 559-570. DOI: 10.3745/KIPSTC.2005.12.4.559.