An Input Domain - Based Software Reliability Growth Model
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 7, No. 11, pp. 3384-3393, Nov. 2000
10.3745/KIPSTE.2000.7.11.3384, PDF Download:
Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
J. Y. Park, D. W. Seo, Y. S. Kim, "An Input Domain - Based Software Reliability Growth Model," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 7, no. 11, pp. 3384-3393, 2000. DOI: 10.3745/KIPSTE.2000.7.11.3384.
[ACM Style]
Joong Yang Park, Dong Woo Seo, and Young Soon Kim. 2000. An Input Domain - Based Software Reliability Growth Model. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 7, 11, (2000), 3384-3393. DOI: 10.3745/KIPSTE.2000.7.11.3384.