Characterizing the Tail Distribution of Android IO Workload


KIPS Transactions on Computer and Communication Systems, Vol. 8, No. 10, pp. 245-250, Oct. 2019
https://doi.org/10.3745/KTCCS.2019.8.10.245,   PDF Download:
Keywords: Android, Trace, Workload, Mobile
Abstract

The use of NAND flash memory has increased rapidly due to the development of mobile fields. However, NAND flash memory has a limited lifespan, so studies are underway to predict its lifespan. Workload is one of the factors that significantly affect the life of NAND flash memory, and workload analysis studies in mobile environments are insufficient. In this paper, we analyze the distribution of workload in the mobile environment by collecting traces generated by using Android-based smartphones. The collected traces can be divided into three groups of hotness. Also they are distributed in the form of heavy tails. We fit this to the Pareto, Lognormal, and Weibull distributions, and Traces are closest to the Pareto distribution.


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Cite this article
[IEEE Style]
C. Park, Y. Won, Y. Park, "Characterizing the Tail Distribution of Android IO Workload," KIPS Transactions on Computer and Communication Systems, vol. 8, no. 10, pp. 245-250, 2019. DOI: https://doi.org/10.3745/KTCCS.2019.8.10.245.

[ACM Style]
Changhyun Park, Youjip Won, and Yongjun Park. 2019. Characterizing the Tail Distribution of Android IO Workload. KIPS Transactions on Computer and Communication Systems, 8, 10, (2019), 245-250. DOI: https://doi.org/10.3745/KTCCS.2019.8.10.245.