Test Input Sequence Generation Strategy for Timing Diagram using Linear Programming


The KIPS Transactions:PartD, Vol. 17, No. 5, pp. 337-346, Oct. 2010
10.3745/KIPSTD.2010.17.5.337,   PDF Download:

Abstract

Timing diagram is popularly utilized for the reason of its advantages; it is convenient for timing diagram to describe behavior of system and it is simple for described behaviors to recognize it. Various techniques are needed to test systems described in timing diagram. One of them is a technique to derive the system into a certain condition under which a test case is effective. This paper proposes a technique to automatically generate the test input sequence to reach the condition for systems described in timing diagram. It requires a proper input set which satisfy transition condition restricted by input waveform and timing constraints to generate a test input sequence automatically. To solve the problem, this paper chooses an approach utilizing the linear programming, and solving procedure is as follows: 1) Get a Timing diagram model as an input, and transforms the timing diagram model into a linear programming problem. 2) Solve the linear programming problem using a linear programming tool. 3) Generate test input sequences of a timing diagram model from the solution of linear programming problem. This paper addresses the formal method to drive the linear programming model from a given timing diagram, shows the feasibility of our approach by prove it, and demonstrates the usability of our paper by showing that our implemented tool solves an example of a timing diagram model.


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Cite this article
[IEEE Style]
H. S. Lee, K. H. Chung, K. H. Choi, "Test Input Sequence Generation Strategy for Timing Diagram using Linear Programming," The KIPS Transactions:PartD, vol. 17, no. 5, pp. 337-346, 2010. DOI: 10.3745/KIPSTD.2010.17.5.337.

[ACM Style]
Hong Seok Lee, Ki Hyun Chung, and Kyung Hee Choi. 2010. Test Input Sequence Generation Strategy for Timing Diagram using Linear Programming. The KIPS Transactions:PartD, 17, 5, (2010), 337-346. DOI: 10.3745/KIPSTD.2010.17.5.337.