Conformance Test Scenario Extraction Techniques for Embedded Software using Test Execution Time
The KIPS Transactions:PartD, Vol. 17, No. 2, pp. 147-156, Apr. 2010
10.3745/KIPSTD.2010.17.2.147, PDF Download:
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Cite this article
[IEEE Style]
I. S. Park, Y. S. Shin, S. H. Ahn, J. S. Kim, J. Y. Kim, W. J. Lee, "Conformance Test Scenario Extraction Techniques for Embedded Software using Test Execution Time," The KIPS Transactions:PartD, vol. 17, no. 2, pp. 147-156, 2010. DOI: 10.3745/KIPSTD.2010.17.2.147.
[ACM Style]
In Su Park, Young Sul Shin, Sung Ho Ahn, Jin Sam Kim, Jae Young Kim, and Woo Jin Lee. 2010. Conformance Test Scenario Extraction Techniques for Embedded Software using Test Execution Time. The KIPS Transactions:PartD, 17, 2, (2010), 147-156. DOI: 10.3745/KIPSTD.2010.17.2.147.